MV Cameras

The Acuros eSWIR VGA series from SWIR Vision Systems deliver crisp images in the range from 400 to 2100 nm. The cameras are designated EAR-99 requiring no license for export.

The 1 Megapixel cameras of the Acuros eSWIR series from SWIR Vision Systems deliver high-resolution images in the visible range up to the extended SWIR (400 - 2100 nm) band.

The Acuros eSWIR HD series from SWIR Vision Systems deliver highest-resolution images in the range from 400 to 2100 nm.

This new series of SWIR coated objective lenses is especially suited for the high resolution InGaAs-free Acuros cameras by SWIR Vision Systems.

The VIS-SWIR HD cameras of the Acuros series from SWIR Vision Systems deliver highest-resolution images in the range from 400 to 1700 nm and this at a favourable price-performance ratio. The cameras are designated EAR-99 requiring no license for export.

The VIS-SWIR 1MP cameras of the Acuros series from SWIR Vision Systems deliver high-resolution images in the visible range up to the SWIR band and this at a favourable price-performance ratio. The cameras are designated EAR-99 requiring no license for export.

The VIS-SWIR VGA cameras of the Acuros series from SWIR Vision Systems deliver crisp images in the visible range up to the SWIR band and this at a favourable price-performance ratio. The cameras are designated EAR-99 requiring no license for export.

9.4 MP, up to 52,000 fps

The PIKA-IR-L+ hyperspectral camera is a high performance camera with high spatial and spectral resolution in the near infrared range (925-1700 nm). It is lightweight and compact, making it ideal for airborne applications.

The PIKA-IR-L hyperspectral camera is a lightweight and compact pushbroom scanner specifically designed for airborne remote sensing applications. It offers fast data acquisition for a wide range of applications.

The Benchtop System - Reflectance/Transmission is a comprehensive system for acquiring hyperspectral reflectance and transmittance data. It is ideal for a variety of laboratory applications, including the analysis of plant leaves, geological samples, and biological specimens.

The Benchtop system for measuring the reflectance of large samples is a powerful and adaptable solution for acquiring detailed spectral information from a variety of large objects.